Dimension 3100 SPM/AFM
The Dimension 3100 Scanning Probe Microscope (SPM/AFM) is in the wetlab adjacent to the cleanroom and produces high-resolution, three dimensional images of nanoscale surface features. It can produce sub-nanometer topographical data for up to a 50μm-square area.
The image is acquired by scanning a sharp tip over the sample surface.The tip is part of a flexible cantilever, and a laser is bounced of the top of the tip to monitor its movements. Voltages applied to the X and Y electrodes on a piezoelectric control system are used produce a precise raster scan.
More: Wikipedia – Atomic Force Microscopy