{"id":298,"date":"2026-02-27T14:19:21","date_gmt":"2026-02-27T19:19:21","guid":{"rendered":"https:\/\/carleton.ca\/share\/?p=298"},"modified":"2026-02-27T14:19:21","modified_gmt":"2026-02-27T19:19:21","slug":"industry-seminar-memory-self-repair","status":"publish","type":"post","link":"https:\/\/carleton.ca\/share\/2026\/industry-seminar-memory-self-repair\/","title":{"rendered":"Industry Seminar: Memory Self-Repair"},"content":{"rendered":"<p>We host an industry seminar by <a href=\"https:\/\/www.linkedin.com\/in\/luc-romain\/?originalSubdomain=ca\" target=\"_blank\" rel=\"noopener\"><strong>Luc Romain<\/strong><\/a>, Principal Software Development Engineer at <strong>Siemens Digital Industries Software<\/strong>.<\/p>\n<p>Luc will present <strong>\u201cIntroduction to Design-For-Test (DFT) and Memory Self-Repair\u201d<\/strong>, offering an overview of modern structural test methodologies used in advanced SoC and ASIC development.<\/p>\n<p><strong>Date:<\/strong> Tuesday, March 3<br \/>\n<strong>Time:<\/strong> 7:00 PM \u2013 8:30 PM<br \/>\n<strong>Location:<\/strong> ME (Mackenzie Building), Room 3235<\/p>\n<h3>About the Talk<\/h3>\n<p>As semiconductor systems continue to scale in complexity, Design-For-Test (DFT) has become a fundamental component of digital IC design. This seminar will introduce key concepts and industrial practices including:<\/p>\n<ul>\n<li>Motivation and fundamentals of DFT<\/li>\n<li>Scan insertion and Automatic Test Pattern Generation (ATPG)<\/li>\n<li>IEEE 1149.1 (JTAG) and IJTAG (1687) standards<\/li>\n<li>Logic BIST and Memory BIST architectures<\/li>\n<li>Fault models and test coverage<\/li>\n<li>Memory self-repair and redundancy techniques<\/li>\n<li>Overview of Siemens Tessent silicon lifecycle solutions<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>We host an industry seminar by Luc Romain, Principal Software Development Engineer at Siemens Digital Industries Software. Luc will present \u201cIntroduction to Design-For-Test (DFT) and Memory Self-Repair\u201d, offering an overview of modern structural test methodologies used in advanced SoC and ASIC development. Date: Tuesday, March 3 Time: 7:00 PM \u2013 8:30 PM Location: ME (Mackenzie [&hellip;]<\/p>\n","protected":false},"author":5,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_relevanssi_hide_post":"","_relevanssi_hide_content":"","_relevanssi_pin_for_all":"","_relevanssi_pin_keywords":"","_relevanssi_unpin_keywords":"","_relevanssi_related_keywords":"","_relevanssi_related_include_ids":"","_relevanssi_related_exclude_ids":"","_relevanssi_related_no_append":"","_relevanssi_related_not_related":"","_relevanssi_related_posts":"","_relevanssi_noindex_reason":"","_mi_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":"","_links_to":"","_links_to_target":""},"categories":[1],"tags":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v21.2 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Industry Seminar: Memory Self-Repair - Specific-domain Hardware Research Laboratory<\/title>\n<meta name=\"description\" content=\"We host an industry seminar by Luc Romain, Principal Software Development Engineer at Siemens Digital Industries Software. Luc will present \u201cIntroduction\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/carleton.ca\/share\/2026\/industry-seminar-memory-self-repair\/\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Arash Ahmadi\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/carleton.ca\/share\/2026\/industry-seminar-memory-self-repair\/\",\"url\":\"https:\/\/carleton.ca\/share\/2026\/industry-seminar-memory-self-repair\/\",\"name\":\"Industry Seminar: Memory Self-Repair - Specific-domain Hardware Research Laboratory\",\"isPartOf\":{\"@id\":\"https:\/\/carleton.ca\/share\/#website\"},\"datePublished\":\"2026-02-27T19:19:21+00:00\",\"dateModified\":\"2026-02-27T19:19:21+00:00\",\"author\":{\"@id\":\"https:\/\/carleton.ca\/share\/#\/schema\/person\/6d2b896d4b1d31635f6ffb65989690e5\"},\"description\":\"We host an industry seminar by Luc Romain, Principal Software Development Engineer at Siemens Digital Industries Software. 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