To investigate microwave devices and circuits for communications applications, the Microwave and Electromagnetics Laboratory is equipped for RF-, microwave- and millimetre-wave testing of packaged or on-wafer devices and components.

Active opto-electronic devices and circuits can be characterized along with RF, MEMS, antennas, multi-layer circuits, on-wafer and packaged devices. The lab is equipped with a probe station with four positioners and high-frequency probes and a large anechoic chamber with associated signal sources and components for accurate, fully automated antenna characterization.